CVE-2024-53017

CVE-2024-53017 is a medium-severity vulnerability in Qualcomm Sdm429w Firmware with a CVSS 3.x base score of 6.6. It is not currently listed as actively exploited by CISA, and its EPSS exploit-prediction score is low. The underlying weakness is classified as CWE-823.

Key facts

Description

Memory corruption while handling test pattern generator IOCTL command.

Frequently asked questions

What is CVE-2024-53017?
Memory corruption while handling test pattern generator IOCTL command.
How severe is CVE-2024-53017?
CVE-2024-53017 has a CVSS 3.x base score of 6.6, rated medium severity. It is exploitable over local access with low attack complexity, requires low privileges and no user interaction. Impact on confidentiality is low, integrity high, and availability low.
Is CVE-2024-53017 being actively exploited?
It is not currently listed in CISA's KEV catalog. Its EPSS exploit-prediction score is 0% (1st percentile), an estimate of the probability of exploitation in the next 30 days.
What products are affected by CVE-2024-53017?
CVE-2024-53017 primarily affects Qualcomm Sdm429w Firmware. In total, 4 product configurations (CPEs) are listed as vulnerable; see the affected-products list for the exact versions.
How do I fix CVE-2024-53017?
Review the linked vendor and NVD advisories for patched versions and mitigations, then upgrade or apply the recommended workaround.
Does CVE-2024-53017 have an EU (EUVD) identifier?
Yes. CVE-2024-53017 is tracked in the ENISA EU Vulnerability Database (EUVD) as EUVD-2024-54636.
When was CVE-2024-53017 published?
CVE-2024-53017 was published on 2025-06-03 and last updated on 2026-06-17.

References

Affected products (4)

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