CVE-2026-41665

CVE-2026-41665 is a medium-severity vulnerability in Samsung One with a CVSS 3.x base score of 6.1. It is not currently listed as actively exploited by CISA, and its EPSS exploit-prediction score is low. The underlying weakness is classified as CWE-190.

Key facts

Description

Integer overflow in scratch buffer initialization size calculation in Samsung Open Source ONE cause incorrect memory initialization for large intermediate tensors. Affected version is prior to commit 1.30.0.

Frequently asked questions

What is CVE-2026-41665?
Integer overflow in scratch buffer initialization size calculation in Samsung Open Source ONE cause incorrect memory initialization for large intermediate tensors. Affected version is prior to commit 1.30.0.
How severe is CVE-2026-41665?
CVE-2026-41665 has a CVSS 3.x base score of 6.1, rated medium severity. It is exploitable over local access with low attack complexity, requires no privileges and user interaction. Impact on confidentiality is none, integrity low, and availability high.
Is CVE-2026-41665 being actively exploited?
It is not currently listed in CISA's KEV catalog. Its EPSS exploit-prediction score is 0% (3rd percentile), an estimate of the probability of exploitation in the next 30 days.
What products are affected by CVE-2026-41665?
CVE-2026-41665 affects Samsung One. See the affected-products list for the exact vulnerable versions.
How do I fix CVE-2026-41665?
Review the linked vendor and NVD advisories for patched versions and mitigations, then upgrade or apply the recommended workaround.
Does CVE-2026-41665 have an EU (EUVD) identifier?
Yes. CVE-2026-41665 is tracked in the ENISA EU Vulnerability Database (EUVD) as EUVD-2026-24622.
When was CVE-2026-41665 published?
CVE-2026-41665 was published on 2026-04-22 and last updated on 2026-06-17.

References

Affected products (1)

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